Figures

Research figures used across application pages.

Combinatorial thin-film workflow for materials-library studies.

Combinatorial thin-film workflow

A material library connects synthesis, high-throughput characterization, data handling, and candidate selection.Ludwig, npj Comput. Mater. 2019, Fig. 1
High-throughput characterization methods for thin-film material libraries.

Library-scale characterization

Composition, structure, magnetic, electrical, optical, mechanical, and microstructure measurements feed measured maps.Ludwig, npj Comput. Mater. 2019, Fig. 2
Processing-library workflow for Al-Cu-O thin-film samples.

Processing-library samples

Deposition conditions, composition, and SEM microstructure are tied to measured library positions.Banko et al., Commun. Mater. 2020, Fig. 1
Microstructure classification across composition and deposition temperature.

Microstructure maps

Image data are organized across composition and process coordinates for microstructure classification.Banko et al., Commun. Mater. 2020, Fig. 2
Structure-zone maps across aluminum content and deposition temperature.

Structure-zone diagram

Measured and predicted microstructure classes define process ranges for thin-film samples.Banko et al., Commun. Mater. 2020, Fig. 6
Variational autoencoder workflow and latent-space plots for XRD patterns.

XRD latent-space analysis

Large diffraction datasets are organized by phase similarity and structure signals before regions are selected.Banko et al., npj Comput. Mater. 2021, Fig. 1
XRD dataset visualization and latent-space grouping.

XRD dataset visualization

Library-scale diffraction data are grouped to compare phase behavior across measured thin-film samples.Banko et al., npj Comput. Mater. 2021, Fig. 2

References

Cited sources.