Platform Characteristics

Deposition-to-characterization path.

01

Multi-element PVD

Co-sputter up to 7 elements onto a 100 mm wafer using DC, RF, pulsed DC, HiPIMS, or reactive sputtering.

02

Physical sample library

Create a real composition-spread thin-film library with 342 registered measurement positions.

03

Composition map

Map element ratios by EDX/EDS or WDX for the material system.

04

Structure and properties

Measure XRD phase data and selected electrical, mechanical, optical, magnetic, or electrochemical response.

05

Scoped follow-up

Scanning droplet cell (SDC), SECCM, XPS, microscopy, or interface analysis can be added when surface change or a localized measurement decides the next step.

06

Next experiment

Measured maps, Bayesian optimization, or Gaussian-process selection support repeat samples or a narrower campaign.

Material decision

Where this applies.

Relevant areas

Relevant systems include high-entropy alloys, complex solid solutions, shape-memory directions, and multicomponent alloy screens.

Experimental plan

Deposit a multielement thin-film library, measure composition and structure, add the property screen tied to the decision, and repeat selected regions in the needed format.

Examples

  • High-entropy alloys
  • Complex solid solutions
  • Shape-memory alloy directions
  • Multicomponent alloy composition screens

Methods used

  • multisource co-sputtering
  • composition-spread libraries
  • XRD mapping
  • nanoindentation
  • four-point probe
  • localized functional screening

Measurements

  • composition
  • phase
  • microstructure
  • hardness or modulus
  • electrical response
  • magnetic or electrochemical response

Outputs

  • alloy composition maps
  • candidate regions
  • excluded phase regions
  • follow-up samples
What comes back: Measured alloy composition ranges for bulk alloy, powder, part-level, or final-format tests.

Figures

Alloy-library and microstructure figures.

Combinatorial thin-film workflow for materials-library studies.

Combinatorial thin-film workflow

A material library connects synthesis, high-throughput characterization, data handling, and candidate selection.Ludwig, npj Comput. Mater. 2019, Fig. 1
Microstructure classification across composition and deposition temperature.

Microstructure maps

Image data are organized across composition and process coordinates for microstructure classification.Banko et al., Commun. Mater. 2020, Fig. 2

Closest Evidence

Closest published alloy demonstrations.

Banko et al., Adv. Mater. 2023

Microscale high-entropy libraries

Dense local libraries provide a method for comparing many high-entropy compositions.Open source

Banko et al., Commun. Mater. 2020

Process-microstructure maps

Processing libraries connect deposition conditions, composition, and microstructure.Open source

Banko et al., Adv. Energy Mater. 2022

High-entropy composition-property trends

Composition-property mapping was used to compare high-entropy material regions.Open source

Platform Basis

Methods behind the screen.

Ludwig, npj Comput. Mater. 2019

Combinatorial thin-film synthesis, high-throughput characterization, data handling, and composition-property mapping.Open source

Banko et al., npj Comput. Mater. 2021

Deep-learning visualization and novelty detection for large XRD datasets from thin-film measurements.Open source

Banko and Ludwig, ACS Comb. Sci. 2020

Experimental materials data management for linked samples, metadata, and analysis workflows.Open source

References

Cited sources.