Applications

Choose the use case.

These use cases cover electrochemical, structural, mechanical, electrical, optical, magnetic, interface, and process-response questions where measured libraries narrow the next test set.

Electrocatalysts

Select catalyst compositions before electrode or cell tests.

We test mixed-metal catalyst libraries to measure local activity, stability, and surface change before the next catalyst test.
  • Water electrolysis OER and HER
  • ORR and mixed electrochemical surface studies
  • CO2 electroreduction with defined product analysis

Complex alloys

Map multicomponent alloy regions before larger builds.

We test alloy and high-entropy material libraries to measure phase, structure, and target properties before bulk or part-level tests.
  • High-entropy alloys
  • Complex solid solutions
  • Shape-memory alloy directions

Oxides and nitrides

Connect oxide and nitride composition to phase and property response.

We test oxide and nitride libraries to measure stoichiometry, phase, hardness, conductivity, optical response, or catalytic response before selected-film tests.
  • Cr-Al-N and related hard nitrides
  • Functional oxides
  • Perovskite oxide libraries

Semiconductor films

Narrow contact, barrier, liner, and cap materials before device tests.

We test semiconductor-relevant thin films to measure resistivity, phase, texture, and process response before tests in a device layer stack.
  • Diffusion barriers
  • Contacts and low-resistance films
  • Liners and caps

RF acoustic films

Select piezoelectric film ranges before resonator builds.

We test RF acoustic film libraries to measure phase, texture, stress indicators, leakage, and fit with the layer stack before resonator-level tests.
  • AlN and doped AlN films
  • AlScN or ScAlN composition ranges
  • Texture and phase screens

Magnetic films

Map magnetic response alongside phase and processing.

We test magnetic thin-film libraries to measure coercivity or related response with composition, phase, texture, and annealing state before tests in the target layer stack.
  • Magnetic multilayers
  • Coercivity screens
  • Reduced-rare-earth directions

Optical films

Measure optical response with phase and conductivity.

We test optical and photoelectrochemical film libraries to measure reflectance, absorption, transparency, conductivity, and phase before tests in the target layer stack.
  • Transparent films
  • Reflectance-tuned films
  • Absorption-tuned films

Protective coatings

Screen conductive protective coatings and layer-stack candidates.

We test coating and interface libraries to map corrosion potential, contact resistance, mechanical response, and surface change before hardware or package-level tests.
  • Bipolar plate coating directions
  • Conductive protective surfaces
  • Adhesion and bonding layers

Platform Characteristics

The same scan loop sits behind each use case.

01

Multi-element PVD

Co-sputter up to 7 elements onto a 100 mm wafer using DC, RF, pulsed DC, HiPIMS, or reactive sputtering.

02

Physical sample library

Create a real composition-spread thin-film library with 342 registered measurement positions.

03

Composition map

Map element ratios by EDX/EDS or WDX for the material system.

04

Structure and properties

Measure XRD phase data and selected electrical, mechanical, optical, magnetic, or electrochemical response.

05

Scoped follow-up

Scanning droplet cell (SDC), SECCM, XPS, microscopy, or interface analysis can be added when surface change or a localized measurement decides the next step.

06

Next experiment

Measured maps, Bayesian optimization, or Gaussian-process selection support repeat samples or narrower campaigns.