Measure optical response with phase and conductivity

Platform Characteristics

Deposition-to-characterization path.

01

Multi-element PVD

Co-sputter up to 7 elements onto a 100 mm wafer using DC, RF, pulsed DC, HiPIMS, or reactive sputtering.

02

Physical sample library

Create a real composition-spread thin-film library with 342 registered measurement positions.

03

Composition map

Map element ratios by EDX/EDS or WDX for the material system.

04

Structure and properties

Measure XRD phase data and selected electrical, mechanical, optical, magnetic, or electrochemical response.

05

Scoped follow-up

Scanning droplet cell (SDC), SECCM, XPS, microscopy, or interface analysis can be added when surface change or a localized measurement decides the next step.

06

Next experiment

Measured maps, Bayesian optimization, or Gaussian-process selection support repeat samples or a narrower campaign.

Material decision

Where this applies.

Relevant areas

Relevant questions include transparent, reflective, absorptive, photonic, photoresponse, and photoelectrochemical thin-film systems.

Experimental plan

Map optical response across thin-film libraries, align spectra with composition and phase, then select samples for coating, layer-stack, or photoresponse tests.

Examples

Transparent films
Reflectance-tuned films
Absorption-tuned films
Photoelectrochemical films

Methods used

UV-VIS spectroscopy
four-point probe
XRD mapping
composition mapping
composition-property visualization

Measurements

reflectance
absorption
band gap
transparency
conductivity
phase
thickness

Outputs

optical-property maps
optical-electrical tradeoff regions
selected films
samples for layer stack tests

What comes back: Measured optical film samples for coating layer stack, photonic-device, or photoelectrochemical tests.

Figures

Optical and oxide-film figures.

High-throughput characterization methods for thin-film material libraries. — Library-scale characterization
Composition, structure, magnetic, electrical, optical, mechanical, and microstructure measurements feed measured maps.Ludwig, npj Comput. Mater. 2019, Fig. 2

XRD dataset visualization and latent-space grouping. — XRD dataset visualization
Library-scale diffraction data are grouped to compare phase behavior across measured thin-film samples.Banko et al., npj Comput. Mater. 2021, Fig. 2

Closest Evidence

Closest optical and oxide-film demonstrations.

Piotrowiak et al., Adv. Eng. Mater. 2023

Perovskite oxide property ranges

Thin-film libraries were used to tailor optical band gap and electrical conductivity.Open source

Piotrowiak et al., ACS Comb. Sci. 2020

Fe-Co-O optical mapping

Composition spreads connected phase, surface morphology, optical response, and electrode-layer stack behavior.Open source

Platform Basis

Methods behind the screen.

Ludwig, npj Comput. Mater. 2019

Combinatorial thin-film synthesis, high-throughput characterization, data handling, and composition-property mapping.Open source

Banko et al., npj Comput. Mater. 2021

Deep-learning visualization and novelty detection for large XRD datasets from thin-film measurements.Open source

References

Cited sources.

Ludwig, A. Discovery of new materials using combinatorial synthesis and high-throughput characterization of thin-film materials libraries combined with computational methods. npj Comput. Mater. 5, 70 (2019).

Combinatorial thin-film synthesis, high-throughput characterization, data handling, and composition-property mapping.

Piotrowiak, T. H.; Zehl, R.; Suhr, E.; Kohnen, B.; Banko, L.; Ludwig, A. Combinatorial Sputter Synthesis of Single-Phase La(XYZ)O3+-sigma Perovskite Thin-Film Libraries: A New Platform for Materials Discovery. Adv. Eng. Mater. 2023, 25 (16), 2300437.

Perovskite oxide thin-film libraries with phase, band-gap, conductivity, and catalyst-relevant screening.

Piotrowiak, T. H.; Wang, X.; Banko, L.; Kumari, S.; Sarker, S.; Mehta, A.; Ludwig, A. High-Throughput Characterization of (FexCo1-x)3O4 Thin-Film Composition Spreads. ACS Comb. Sci. 2020, 22 (12), 804-812.

Fe-Co-O composition spreads with phase, surface, optical, and electrode-stack-related characterization.

Banko, L.; Maffettone, P. M.; Naujoks, D.; Olds, D.; Ludwig, A. Deep learning for visualization and novelty detection in large X-ray diffraction datasets. npj Comput. Mater. 7, 104 (2021).

Deep-learning visualization and novelty detection for large XRD datasets from thin-film measurements.

All applications Evidence library

Measure optical response with phase and conductivity.

Deposition-to-characterization path.

Multi-element PVD

Physical sample library

Composition map

Structure and properties

Scoped follow-up

Next experiment

Where this applies.

Relevant questions include transparent, reflective, absorptive, photonic, photoresponse, and photoelectrochemical thin-film systems.

Map optical response across thin-film libraries, align spectra with composition and phase, then select samples for coating, layer-stack, or photoresponse tests.

Optical and oxide-film figures.

Closest optical and oxide-film demonstrations.

Perovskite oxide property ranges

Fe-Co-O optical mapping

Methods behind the screen.

Cited sources.

Ludwig, A. Discovery of new materials using combinatorial synthesis and high-throughput characterization of thin-film materials libraries combined with computational methods. npj Comput. Mater. 5, 70 (2019).

Piotrowiak, T. H.; Zehl, R.; Suhr, E.; Kohnen, B.; Banko, L.; Ludwig, A. Combinatorial Sputter Synthesis of Single-Phase La(XYZ)O3+-sigma Perovskite Thin-Film Libraries: A New Platform for Materials Discovery. Adv. Eng. Mater. 2023, 25 (16), 2300437.

Piotrowiak, T. H.; Wang, X.; Banko, L.; Kumari, S.; Sarker, S.; Mehta, A.; Ludwig, A. High-Throughput Characterization of (FexCo1-x)3O4 Thin-Film Composition Spreads. ACS Comb. Sci. 2020, 22 (12), 804-812.

Banko, L.; Maffettone, P. M.; Naujoks, D.; Olds, D.; Ludwig, A. Deep learning for visualization and novelty detection in large X-ray diffraction datasets. npj Comput. Mater. 7, 104 (2021).