Technical basis

The team connects deposition hardware, registered measurements, and local measurement data.

Concept visual of a circular wafer library beside larger coated sample formats.

Physical workflow

Measured wafer libraries guide selected follow-up films before custom targets or larger validation runs.
Concept visual of a measurement head over a circular wafer library.

Registered measurements

Measurement positions stay tied to wafer coordinates, local composition, and structure or property response.
Concept visual of a local electrochemical probe over a circular wafer library.

Local measurement data

Electrochemical, surface, structure, and film-property measurements turn the physical library into a measured map.

People

Built around physical deposition and measured maps.

CTO

Dr.-Ing. Lars Banko

xemX materials space exploration GmbH, Bochum

Lars built the combinatorial PVD and automated characterization system behind xemX, connecting deposition hardware, XRD mapping, plasma diagnostics, electrochemical screening, and data workflows.

COO

M.Sc. Sven Maihöfer

xemX materials space exploration GmbH, Bochum

Sven leads operations, partnerships, and project coordination so coating, surface, and material questions can become scoped screening or prototype projects.

Scientific Advisor

Prof. Dr.-Ing. Alfred Ludwig

Ruhr-Universität Bochum

Alfred Ludwig's group developed the thin-film library and high-throughput characterization methods behind the xemX approach.

Scientific Advisor

Prof. Dr. Wolfgang Schuhmann

Ruhr-Universität Bochum

Wolfgang Schuhmann brings electrochemical and surface-measurement depth for catalyst, corrosion, and localized response questions.